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This paper aims to present certain issues in direct bonded copper (DBC) technology towards the manufacture of Al2O3 or AlN ceramic substrates with one or both sides clad with a copper (Cu) layer.

As part of the experimental work, attempts were made to produce patterns printed onto DBC substrates based on four substantially different technologies: precise cutting with a diamond saw, photolithography, the use of a milling cutter (LPKF ProtoMat 93s) and laser ablation with differential chemical etching of the Cu layer.

The use of photolithography and etching technology in the case of boards clad with a 0.2-mm-thick Cu layer, can produce conductive paths with a width of 0.4 mm while maintaining a distance of 0.4 mm between the paths, and in the case of boards clad with a 0.3-mm-thick copper layer, conductive paths with a width of 0.5 mm while maintaining a distance of 0.5 mm between paths. The application of laser ablation at the final step of removing the unnecessary copper layer, can radically increase the resolution of printed pattern even to 0.1/0.1 mm. The quality of the printed pattern is also much better.

Etching process optimization and the development of the fundamentals of technology and design of power electronic systems based on DBC substrates should be done in the future. A limiting factor for further research and its implementation may be the relatively high price of DBC substrates in comparison with typical PCB printed circuits.

Several examples of practical implementations using DBC technology are presented, such as full- and half-bridge connections, full-wave rectifier with an output voltage of 48 V and an output current of 50 A, and part of a battery discharger controller and light-emitting diode illuminator soldered to a copper heat sink.

The paper presents a comparison of different technologies used for the realization of precise patterns on DBC substrates. The combination of etching and laser ablation technologies radically improves the quality of DBC-printed patterns.

The purpose of this study is to develop a reconstruction and measurement system for data analysis using ultrasonic transmission tomography. The problem of reconstruction from the projection is encountered in practical implementation, which consists in reconstructing an image that is an estimation of an unknown object from a finite set of projection data. Reconstructive algorithms used in transmission tomography are based on linear mathematical models, which makes it necessary to process non-linear data into estimates for a finite number of projections. The application of transformation methods requires building a mathematical model in which the projection data forming the known and unknown quantities are functions with arguments from a continuous set of real numbers, determining the function describing the unknown quantities sought in the form of inverse relation and adapting it to operate on discrete and noisy data. This was done by designing a tomographic device and proprietary algorithms capable of reconstructing two-dimensional images regardless of the size, shape, location or number of inclusions hidden in the examined object.

The application consists of a device and measuring sensors, as well as proprietary algorithms for image reconstruction. Ultrasonic transmission tomography makes it possible to analyse processes occurring in an object without interfering with the examined object. The proposed solution uses algorithms based on ray integration, the Fermat principle and deterministic methods. Two applications were developed, one based on C and implemented on the embedded device, while the other application was made in Matlab.

Research shows that ultrasonic transmission tomography provides an effective analysis of tested objects in closed tanks.

In the presented technique, the use of ultrasonic absorption wave has been limited. Nevertheless, the effectiveness of such a solution has been confirmed.

The presented solution can be used for research and monitoring of technological processes.

Author’s tomographic system consisting of a measuring system and image reconstruction algorithms.